Recent developments in optical gauge block metrology : 20-21 July 1998, San Diego, California /
Corporate Author: | |
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Other Authors: | , |
Format: | Unknown |
Language: | English |
Published: |
Bellingham, Wash., USA :
SPIE,
[1998]
|
Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 3477. |
Subjects: |