Speckle metrology, 2003 : proceedings : 18-20 June, 2003, Trondheim, Norway /
Corporate Authors: | , , , , |
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Other Authors: | , , |
Format: | Book |
Language: | English |
Published: |
Bellingham, Wash. :
SPIE,
[2003]
|
Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 4933. |
Subjects: |
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Lehigh
Call Number: |
Electronic book |
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