Defects and diffusion in semiconductors. an annual retrospective / XI :
This eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volume 272). As well as the 295 metals abstracts, the issue includes - in line with the new editorial policy of including orig...
Other Authors: | |
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Format: | Book |
Language: | English |
Published: |
Stafa-Zuerich, Switzerland :
TTP, Trans Tech Publications,
[2008]
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Series: | Diffusion and defect data. Defect and diffusion forum ;
v. 282. |
Subjects: |
Summary: | This eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volume 272). As well as the 295 metals abstracts, the issue includes - in line with the new editorial policy of including original papers on all of the major material groups: ""Structural and Electron-Hopping Studies of Pr- and Nd-Substituted La2/3Ba1/3MnO3 Manganites"" (H. Abdullah and S.A. Halim), ""Recrystallization Annealing of Cold-Rolled 9Cr-1Mo Ferritic Steel Containing Silicon"" (M.N. Mungole, M. Surender, R. Balasubram |
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Physical Description: | 1 online resource (154 pages) : illustrations |
Bibliography: | Includes bibliographical references and indexes. |
ISBN: | 9783038132080 303813208X |
ISSN: | 1012-0386 ; |