System and Bayesian reliability essays in honor of Professor Richard E. Barlow on his 70th birthday /
Corporate Authors: | , |
---|---|
Other Authors: | , , , |
Format: | Electronic Book |
Language: | English |
Published: |
River Edge, NJ :
World Scientific,
c2001.
|
Series: | Series on quality, reliability & engineering statistics ;
v. 5. |
Subjects: |
This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.