Search Results - "Semiconductors."

1

An electrochemical capacitance-voltage technique for the determination of pseudomorphic high electron mobility transistor material parameters /

An electrochemical capacitance-voltage technique for the determination of pseudomorphic high electron mobility transistor material parameters /

by Leoni, Robert E., 1970-
1995

Subjects: “...Semiconductors....”

Thesis Book

2

Performance and radiation damage effect in field-effect transistor /

Performance and radiation damage effect in field-effect transistor /

by Olasupo, Kolawole Rahman
1990

Subjects: “...Metal oxide semiconductors....”

Thesis Book

3

Automated simulation of 3-D crack propagation on bimaterial interfaces in semiconductor packages /

Automated simulation of 3-D crack propagation on bimaterial interfaces in semiconductor packages /

by Herr, Alexander F. (Alexander Frantz), 1979-
2003

Subjects: “...Semiconductors Junctions....”

Thesis Book

4

Measurement of interface states in metal-oxide-semi conductor structures at very low frequencies using quasi-static technique.

Measurement of interface states in metal-oxide-semi conductor structures at very low frequencies using quasi-static technique.

by Das, Nalani R.
1970

Subjects: “...Semiconductors...”

Thesis Book

5

The preparation and properties of thin silicon films deposited on amorphous substrates by cathodic sputtering.

The preparation and properties of thin silicon films deposited on amorphous substrates by cathodic sputtering.

by Kumagai, Henry Yasuo
1964

Subjects: “...Semiconductors...”

Thesis Book

6

Measurement of low frequency noise in mos structures with 20-40 thick oxides.

Measurement of low frequency noise in mos structures with 20-40 thick oxides.

by Kumar, Vikram
1972

Subjects: “...Semiconductors...”

Thesis Book

7

A critical study of the different methods of investigating semiconductor-insulator interface state properties.

A critical study of the different methods of investigating semiconductor-insulator interface state properties.

by Kar, Samares
1968

Subjects: “...Semiconductors...”

Thesis Book

8

Noise in alloy junction transistors.

Noise in alloy junction transistors.

by Brennan, Thomas Frederick
1967

Subjects: “...Semiconductors...”

Thesis Book

9

A microwave method for measuring resistivity of semiconductors.

A microwave method for measuring resistivity of semiconductors.

by Seifert, James R.
1964

Subjects: “...Semiconductors...”

Thesis Book

10

A direct reading resisitvity test set for semiconductor materials.

A direct reading resisitvity test set for semiconductor materials.

by Lagarde, A. Konrad
1968

Subjects: “...Semiconductors...”

Thesis Book

11

The application of the DC-dopant profile method to short channel length devices /

by Barton, Daniel Lee, 1962-
1988

Subjects: “...Semiconductors Testing....”

Thesis Book

12

Defect distribution of through-oxide boron-implanted silicon with and without fluorine incorporation /

Defect distribution of through-oxide boron-implanted silicon with and without fluorine incorporation /

by Lam, Amy C., 1968-
1992

Subjects: “...Semiconductors Defects....”

Thesis Book

13

Kinetic studies of NF3-silicon using a parallel plate plasma reactor /

Kinetic studies of NF3-silicon using a parallel plate plasma reactor /

by Akiki, Gregory Shekrallah, 1960-
1985

Subjects: “...Semiconductors Etching....”

Thesis Book

14

An investigation of the effect of a constant electric field on the diffusion of gold in silicon.

An investigation of the effect of a constant electric field on the diffusion of gold in silicon.

by Peterson, Roger D.
1967

Subjects: “...Semiconductors Diffusion...”

Thesis Book

15

An analytical model for LDD MOS transistors in the breakdown mode /

An analytical model for LDD MOS transistors in the breakdown mode /

by Kozlowski, Zbigniew A., 1948-
1992

Subjects: “...Metal oxide semiconductors....”

Thesis Book

16

A study of thermal oxides on 6H-SIC for power device applications /

A study of thermal oxides on 6H-SIC for power device applications /

by Vathulya, Vickram R., 1974-
1997

Subjects: “...Semiconductors....”

Thesis Book

17

Dielectric dispersion properties and relaxation time of semi insulating polycrystalline silicon (SIPOS) /

Dielectric dispersion properties and relaxation time of semi insulating polycrystalline silicon (SIPOS) /

by Keller, Scott David, 1962-
1989

Subjects: “...Polycrystalline semiconductors....”

Thesis Book

18

Retention endurance and interface traps in MONOS memory transistors /

Retention endurance and interface traps in MONOS memory transistors /

by Roy, Anirban, 1962-
1985

Subjects: “...Metal oxide semiconductors....”

Thesis Book

19

Nitrogen implanted polycrystalline silicon resistors /

Nitrogen implanted polycrystalline silicon resistors /

by Peridier, Carl Alexis, 1953-
1986

Subjects: “...Semiconductors....”

Thesis Book

20

Stress effects and oxidant diffusion in the planar oxidation /

Stress effects and oxidant diffusion in the planar oxidation /

by Lin, Ming-Tzer, 1972-
1999

Subjects: “...Semiconductors....”

Thesis Book

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