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Proceedings : 6th IEEE International On-Line Testing Workshop : July 3-5, 2000, Palma De Mallorca, Spain /
Los Alamitos, Calif. : IEEE Computer Society, 2000

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2
Fourth IEEE International Symposium on Electronic Design, Test and Applications proceedings : [Delta] '08, 23-25 January 2008, Hong Kong, SAR, China /
Los Alamitos, Calif. : IEEE Computer Society, 2008

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3
Sixth International Workshop on Microprocessor Test and Verification common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005 /
Los Alamitos, Calif. : IEEE, 2006

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4
Proceedings, IOLTS 2007 13th IEEE International On-Line Testing Symposium : Heraklion, Crete, Greece, 8-11 July, 2007 /
[Piscataway, N.J.] : IEEE Xplore, 2007

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5
HLDVT '11 IEEE International High Level Design Validation and Test Workshop : conference proceedings : [sixteenth annual workshop] : November 10-11, 2011 : Napa Valley Marriott, Napa Valley, CA /
[Piscataway, N.J.] : IEEE, 2011

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6
Proceedings 2009 Asian Test Symposium : ATS 2009 : 23-26 November, 2009, Taichung, Taiwan /
Los Alamitos, Calif. : IEEE Computer Society, 2009

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7
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems April 13-15, 2011, Cottbus, Germany /
Piscataway, N.J. : IEEE, 2011

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8
ETS 2007 12th IEEE European Test Symposium : proceedings : 20-24 May 2007, Freiburg, Germany /
Los Alamitos, Calif. : IEEE Computer Society Press, 2007

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9
2010 28th IEEE VLSI Test Symposium proceedings : VTS 2010 : 19-22 April 2010 Santa Cruz, CA, USA /
[Los Alamitos, Calif.] : IEEE Computer Society, 2010

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10
Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) 10-12 July, 2002, Isle of Bendor, France /
[Piscataway, N.J.] : IEEE, 2002

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11
Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 18-21, 2006, Prague, Czech Republic /
Los Alamitos, Calif. : IEEE Computer Society, 2006

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12
Seventh International Workshop on Microprocessor Test and Verification proceedings : MTV 2006 : Austin, Texas, 4-5 December, 2006 /
Los Alamitos, Calif. : IEEE Computer Society, 2007

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13
Proceedings 14th IEEE International On-Line Testing Symposium : Rhodes, Greece, July 6-9, 2008 /
Los Alamitos, Calif. : IEEE Computer Society, 2008

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14
Proceedings of the 2011 IEEE 17th International On-line Testing Symposium 13-15 July 2011 : Athens, Greece /
[Piscataway, N.J.] : IEEE, 2011

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15
Proceedings of the 16th Asian Test Symposium 8-11 October, 2007, Beijing, China /
Los Alamitos, Calif. : IEEE Computer Society, 2007

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16
Proceedings of the 17th Asian Test Symposium November 24-27, 2008 Sapporo, Japan /
Los Alamitos, Calif. : IEEE Computer Society, 2008

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17
Third IEEE International Workshop on Electronic Design, Test and Applications proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia /
Los Alamitos, Calif. : IEEE Computer Society, 2006

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18
Proceedings of the 2012 IEEE 18th International On-line Testing Symposium (IOLTS) 27-29 June 2012, Sitges, Spain /
[Piscataway, N.J.] : IEEE, 2012

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19
Proceedings of IEEE East-West Design & Test Symposium (EWDTS '08) Lviv, Ukraine, October 9-12, 2008 /
Piscataway, NJ : IEEE, 2008

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20
DELTA 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications : proceedings : 13-15 January 2010, Ho Chi Minh City, Vietnam /
Los Alamitos, Calif. : IEEE Computer Society, 2010

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