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1
Handbook of visual display technology /
Cham, Switzerland : Springer, 2016
2nd ed.

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2
Silicon photonics for telecommunications and biomedicine /
Boca Raton : CRC Press, 2012

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3
Polymers in electronics : based on a symposium sponsored by the division of organic coatings and plastics chemistry at the 185th meeting of the american chemical society, seattle, washington, march 20-25, 1983 /
Washington, DC : American Chemical Society, 1984

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4
ISTFA 2004 : Proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Materials Park, OH : ASM International, 2004

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5
Microelectronics processing : inorganic materials characterization /
Washington, DC : American Chemical Society, 1986

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6
ISTFA 2003 : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Materials Park, Ohio : ASM International, 2003

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7
Planar Waveguide Optical Sensors : From Theory to Applications /

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8
ISTFA 2002 : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Materials Park, OH : ASM International, 2002

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9
ISTFA '96 : proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Materials Park, Ohio : ASM International, 1996

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10
Flexible and stretchable electronic composites /
Cham : Springer, 2016

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11
Investigations on microstructure and mechanical properties of the Cu/Pb-free solder joint interfaces /
由 Zhang, Qingke
Berlin : Springer, 2016

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12
Istfa 2008 : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Materials Park, OH : Asm International, 2008

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13
Polymer materials for electronic applications : based on a symposium sponsored by the division of organic coatings and plastics chemistry at the second chemical congress of the north american continent (180th acs national meeting), las vegas, nevada, august 26-27, 1980 /
Washington, DC : American Chemical Society, 1982

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14
ISTFA 2000 : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Materials Park, OH : ASM International, 2000

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15
Industrial applications of surface analysis /
Washington, DC : American Chemical Society, 1982

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16
Multicomponent silicides for thermoelectric materials : phase stabilities, synthesis, and device tailoring /
由 Tedenac, J. C. (Jean-Claude)
Cham : Springer, 2017

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17
ISTFA '99 : proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Materials Park, OH : ASM International, 1999

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18
Resins for aerospace : based on a symposium sponsored by the acs division of organic coatings and plastics chemistry at the acs/csj chemical congress (177th acs national meeting), honolulu, hawaii, april 3-6, 1979 /
Washington, DC : American Chemical Society, 1980

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19
Surfaces and interfaces of electronic materials /
由 Brillson, L. J.
Weinheim : Wiley-VCH : IEEE, 2010

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20
Proceedings of the Symposium on the Degradation of Electronic Devices Due to Device Operation as Well as Crystalline and Process-Induced Defects /
Pennington, NJ : Electrochemical Society, 1994

Conference Proceeding 圖書
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