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1
National Semiconductor Metrology Program /
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995

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Government Document Periódico
2
Surge protection in low-voltage AC power circuits-- an anthology.
Por Martzloff, François D.
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2002

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Government Document Livro
3
North American ISDN Users' Forum (NIUF) minutes publication.

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Government Document Periódico
4
Next-Generation Fire Suppression Technology Program (NGP) 1998 technical highlights /
Por Gann, Richard G., 1944-
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999

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Government Document Livro
5
Face recognition vendor test 2002 performance metrics /
Por Grother, Patrick J.
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2003

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Government Document Livro
6
Surge protection in low-voltage AC power circuits-- an anthology.
Por Martzloff, François D.
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2002

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Government Document Livro
7
Energy dissipation devices for bridges with steel superstructures /
Por Riley, Michael A.
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2003

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Government Document Livro
8
Ultrasonic evaluation methods applicable to polymer concrete composites /
Por Garbacz, Andrzej
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2003

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Government Document Livro
9
North American ISDN Users' Forum (NIUF) : minutes publication.

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Government Document Periódico
10
Protection profile development : version 1.0 / National Institute of Standards and Technology & National Security Agency.
[Washington, D.C.] : National Institute of Standards and Technology : National Security Agency, 1992

Livro
11
Detail specification for 62.5-um core diameter/125-um cladding diameter class Ia multimode, graded index optical waveguide fibers.
[S.l. : Electronic Industries Association, Engineering Dept., 1989

Livro
12
National Voluntary Laboratory Accreditation Program : calibration laboratories : technical guide for optical radiation measurements /
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2001

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Government Document Livro
13
An assessment of the United States Measurement System : addressing measurement barriers to accelerate innovation /
Por Swyt, Dennis A.
Gaithersburg, MD : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, 2006

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Government Document Livro
14
The FERET evaluation methodology for face-recognition algorithms
Gaithersburg, MD : Washington, D.C. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; U.S. Dept. of Energy, 1998

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Government Document Livro
15
Hot isostatic pressing : theory and applications : proceedings of the Second International Conference, Gaithersburg, Maryland, USA, 7-9 June 1989 /
Materials Park, Ohio : ASM International, 1991

Conference Proceeding Livro
16
NIST-International Sematech e-handbook : NIST Handbook 148.
[Gaithersburg, Md.] : National Institute of Standards and Technology, 2003

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Livro
17
Twenty Second Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM proceedings 2006 : Dallas, TX, USA, March 14-16, 2006 /
Piscataway, N.J. : IEEE, 2006

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Recurso Electrónico Conference Proceeding Livro
18
Twenty Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM Proceedings 2007, San Jose, CA USA, March 18-22, 2007 /
[Piscataway, N.J.] : IEEE, 2007

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Recurso Electrónico Conference Proceeding Livro
19
IEEE 9th VLSI Packaging Workshop in Japan VPWJ 2008 : December 1st-2nd, 2008, the Westin Miyako Kyoto, Kyoto, Japan /
Piscataway, NJ : IEEE, 2008

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Recurso Electrónico Conference Proceeding Livro
20
Guidelines for implementing the new representations of the volt and ohm effective January 1, 1990 /
Gaitherburg, MD : Washington, DC : U.S. Dept. of Commerce, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1989

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Government Document Livro
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