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1
National Semiconductor Metrology Program /
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995

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Κυβερνητικό Έγγραφο Περιοδική έκδοση
2
Surge protection in low-voltage AC power circuits-- an anthology.
ανά Martzloff, François D.
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2002

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3
North American ISDN Users' Forum (NIUF) minutes publication.

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4
Next-Generation Fire Suppression Technology Program (NGP) 1998 technical highlights /
ανά Gann, Richard G., 1944-
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999

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5
Face recognition vendor test 2002 performance metrics /
ανά Grother, Patrick J.
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2003

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6
Surge protection in low-voltage AC power circuits-- an anthology.
ανά Martzloff, François D.
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2002

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Κυβερνητικό Έγγραφο Βιβλίο
7
Energy dissipation devices for bridges with steel superstructures /
ανά Riley, Michael A.
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2003

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8
Ultrasonic evaluation methods applicable to polymer concrete composites /
ανά Garbacz, Andrzej
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2003

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Κυβερνητικό Έγγραφο Βιβλίο
9
North American ISDN Users' Forum (NIUF) : minutes publication.

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Κυβερνητικό Έγγραφο Περιοδική έκδοση
10
Protection profile development : version 1.0 / National Institute of Standards and Technology & National Security Agency.
[Washington, D.C.] : National Institute of Standards and Technology : National Security Agency, 1992

Βιβλίο
11
Detail specification for 62.5-um core diameter/125-um cladding diameter class Ia multimode, graded index optical waveguide fibers.
[S.l. : Electronic Industries Association, Engineering Dept., 1989

Βιβλίο
12
National Voluntary Laboratory Accreditation Program : calibration laboratories : technical guide for optical radiation measurements /
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2001

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13
An assessment of the United States Measurement System : addressing measurement barriers to accelerate innovation /
ανά Swyt, Dennis A.
Gaithersburg, MD : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, 2006

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Κυβερνητικό Έγγραφο Βιβλίο
14
The FERET evaluation methodology for face-recognition algorithms
Gaithersburg, MD : Washington, D.C. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; U.S. Dept. of Energy, 1998

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15
Hot isostatic pressing : theory and applications : proceedings of the Second International Conference, Gaithersburg, Maryland, USA, 7-9 June 1989 /
Materials Park, Ohio : ASM International, 1991

Πρακτικό Συνεδρίου Βιβλίο
16
NIST-International Sematech e-handbook : NIST Handbook 148.
[Gaithersburg, Md.] : National Institute of Standards and Technology, 2003

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Βιβλίο
17
Twenty Second Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM proceedings 2006 : Dallas, TX, USA, March 14-16, 2006 /
Piscataway, N.J. : IEEE, 2006

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Ηλεκτρονική πηγή Πρακτικό Συνεδρίου Βιβλίο
18
Twenty Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM Proceedings 2007, San Jose, CA USA, March 18-22, 2007 /
[Piscataway, N.J.] : IEEE, 2007

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19
IEEE 9th VLSI Packaging Workshop in Japan VPWJ 2008 : December 1st-2nd, 2008, the Westin Miyako Kyoto, Kyoto, Japan /
Piscataway, NJ : IEEE, 2008

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20
Guidelines for implementing the new representations of the volt and ohm effective January 1, 1990 /
Gaitherburg, MD : Washington, DC : U.S. Dept. of Commerce, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1989

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