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1
ITC : International Test Conference 1999 proceedings : September 28-30, 1999, New Atlantic City Convention Center, Atlantic City, NJ, USA /
Washington, DC : Piscataway New Jersey : International Test Conference ; IEEE, 1999

Atti del Convegno Libro
2
Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. /
Washington, D.C. : Los Angeles, CA : Computer Society Press of the IEEE ; Order from Computer Society of the IEEE, 1987

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3
Memory LSI : digest of papers /
New York : Institute of Electrical and Electronics Engineers, 1977

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4
Digest of papers : Memory & LSI /
New York : Institute of Electrical and Electronics Engineers, 1976

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5
Memory, LSI, linear IC : digest of papers /
Long Beach, Calif. : IEEE Computer Society Publications Office, 1975

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6
ITC : International Test Conference : proceedings : October 18-23, 1998, Marriott Wardman Park Hotel, Washington, D.C., USA /
Washington, DC : Piscataway New Jersey : International Test Conference ; IEEE, 1998

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7
Proceedings : Testing's changing role /
Silver Spring, MD (1109 Spring St., Suite 300, Silver Spring, 20910) : IEEE Computer Society Press, 1983

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8
Memory & LSI, Linear IC : digest of papers, 1975 Semiconductor Test Symposium, October 14-16, 1975, held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
New York : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; available from IEEE Computer Society Publications Office, 1975

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Atti del Convegno Libro
9
Memory & LSI : digest of papers /
New York : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; available from IEEE Computer Society Publications Office, 1976

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Atti del Convegno Libro
10
International Test Conference 2011 : [42nd] Proceedings : September 18-23, 2011 : Disneyland Hotel, Anaheim, California USA /
[Piscataway, N.J.] : IEEE Computer Society, 2011

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
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11
International Test Conference 2012 : [43rd] Proceedings : November 6-8, 2012 : Disneyland Hotel, Anaheim, California USA /
[Piscataway, N.J.] : IEEE Computer Society, 2012

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
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12
1986 IEEE Workstation Technology & Systems Conference : proceedings, Bally's Park Place Casino Hotel--Atlantic City, N.J. March 17-20, 1986 /
Washington, D.C. : Los Angeles, CA : IEEE Computer Society Press ; Order from IEEE Computer Society, 1986

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13
Proceedings /

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14
Integration of test with design and manufacturing : International Test Conference, 1987, proceedings, September 1, 2, 3, 1987 /
Washington, D.C. : IEEE Computer Society Press, 1987

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15
Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /
Washington, D.C. : IEEE Computer Society Press, 1986

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16
The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /
Washington, D.C. : Los Angeles, CA : IEEE Computer Society Press ; Order from IEEE Computer Society, 1985

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17
Memory & LSI : digest of papers /
New York : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; available from IEEE Computer Society Publications Office, 1977

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18
Memory & LSI; digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
New York : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; available from IEEE Computer Society Publications Office, 1974

Atti del Convegno Libro
19
International Test Conference : proceedings : October 18-23, 1998, Marriott Wardman Park Hotel, Washington, D.C., USA /
Washington, DC : Piscataway New Jersey : International Test Conference ; IEEE, 1998

Atti del Convegno Libro
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