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1
International Test Conference, 1993 : proceedings.
Altoona, PA : Piscataway, NJ : International Test Conference ; [Distributor] IEEE Service Center, 1993

Conference Proceeding Book
2
International Test Conference, 1992 : proceedings.
Altoona, PA : Piscataway, NJ : The Conference ; Copies can be ordered from IEEE Service Center, 1992

Conference Proceeding Book
3
1983 IEEE ATPG workshop proceedings : March 15-16, 1983, San Francisco, California.
Silver Spring, MD : IEEE Computer Society Press, 1983

Conference Proceeding Book
4
ATFA-77 : advanced techniques in failure analysis : [proceedings]
[New York] : IEEE, 1977

Book
5
Record. 1973-

Conference Proceeding Book
6
Proceedings [of the] Advanced Techniques in Failure Analysis Symposium.

Conference Proceeding
7
Proceedings : ATFA-77, Advanced Techniques in Failure Analysis, 27-29 September 1977, Airport Marriott Hotel, Los Angeles, California USA /
New York : Institute of Electrical and Electronics Engineers, 1977

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Conference Proceeding Book
8
2009 27th IEEE VLSI Test Symposium proceedings : 3-7 May 2009 Santa Cruz, CA, USA : VTS 2009 /
Los Alamitos, Calif. : IEEE Computer Society, 2009

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Electronic Conference Proceeding Book
9
IEEE Autotestcon 2009 proceedings Systems Readiness Technology Conference "mission assurance through advanced ATE" /
Piscataway, NJ : IEEE, 2009

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Electronic Conference Proceeding Book
10
25th IEEE VLSI Test Symposium proceedings : 6-10 May, 2007, Berkeley, California /
Los Alamitos, Calif. : IEEE Computer Society, 2007

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Electronic Conference Proceeding Book
11
Sixth International Workshop on Microprocessor Test and Verification common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005 /
Los Alamitos, Calif. : IEEE, 2006

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Electronic Conference Proceeding Book
12
MTV 2009 10th International Workshop on Microprocessor Test and Verification : proceedings, 7-9 December 2009, Austin, TX, USA.
Los Alamitos, Calif. : IEEE Computer Society, 2009

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Electronic Conference Proceeding Book
13
IEEE design & test of computers

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Electronic Journal
14
ETS 2009 European Test Symposium : proceedings, 25-29 May, 2009, Sevilla, Spain.
Los Alamitos, Calif. : IEEE Computer Society, 2009

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Electronic Conference Proceeding Book
15
HLDVT '11 IEEE International High Level Design Validation and Test Workshop : conference proceedings : [sixteenth annual workshop] : November 10-11, 2011 : Napa Valley Marriott, Napa Valley, CA /
[Piscataway, N.J.] : IEEE, 2011

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Electronic Conference Proceeding Book
16
Proceedings Fourth International Conference on Software Testing, Verification, and Validation Workshops Berlin, Germany, 21-25 March 2011 /
Los Alamitos, Calif. : IEEE Computer Society, 2011

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Electronic Conference Proceeding Book
17
IEEE/ACM International Conference on Computer Aided Design digest of technical papers, DoubleTree Hotel, San Jose, San Jose, California, November 5-8, 2007 /
Piscataway, NJ. : IEEE Service Center, 2007

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Electronic Conference Proceeding Book
18
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems April 13-15, 2011, Cottbus, Germany /
Piscataway, N.J. : IEEE, 2011

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Electronic Conference Proceeding Book
19
Proceedings, 2009 Testing: Academic and Industrial Conference Practice and Research Techniques TAIC PART 2009 : 4-6 September 2009 : [Cumberland Lodge], Windsor, United Kingdom /
Los Alamitos, Calif. : Piscataway, N.J. : IEEE Computer Society ; IEEE, 2009

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Electronic Conference Proceeding Book
20
IEEE Autotestcon 2010 moving forward at the speed of light : proceedings : Mariott World, September 13-16, 2010, Orlando, FL.
Piscataway, N.J. : IEEE, 2010

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Electronic Conference Proceeding Book
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