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21
Microelectronic failure analysis desk reference.
Materials Park, Ohio : ASM International, 2002
Subjects: “...Semiconductors Defects Handbooks, manuals, etc....”

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Electronic Book
22
Microelectronics failure analysis : desk reference /
Materials Park, Ohio : ASM International, 2019
Seventh edition.
Subjects: “...Semiconductors Defects Handbooks, manuals, etc....”

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Book
23
Microelectronic failure analysis desk reference : 2001 supplement /
Materials Park, Ohio : ASM International, 2001
[4th ed.]
Subjects: “...Semiconductors Defects Handbooks, manuals, etc....”

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Electronic Book
24
Microelectronic failure analysis : desk reference : 2001 supplement /
Materials Park, OH : ASM International, 2001
Subjects: “...Semiconductors Defects Handbooks, manuals, etc....”

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
25
Microelectronic failure analysis : desk reference : 2002 supplement /
Materials Park, Ohio : ASM International, 2002
Subjects: “...Semiconductors Defects Handbooks, manuals, etc....”

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
26
Wire bonding in microelectronics /
by Harman, George G.
New York : McGraw-Hill, 2010
3rd ed.
Subjects: “...Semiconductors Failures. http://id.loc.gov/authorities/subjects/sh86006952...”

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Book
27
High-speed VLSI interconnections /
by Goel, Ashok K., 1953-
Hoboken, N.J. : Wiley-Interscience : IEEE Press, 2007
2nd ed.
Subjects: “...Semiconductors Junctions. http://id.loc.gov/authorities/subjects/sh85119913...”

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
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