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1
ISTFA 2004 : Proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Materials Park, OH : ASM International, 2004

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Conference Proceeding Book
2
ISTFA 2003 : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Materials Park, Ohio : ASM International, 2003

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Conference Proceeding Book
3
ISTFA 2002 : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Materials Park, OH : ASM International, 2002

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Conference Proceeding Book
4
ISTFA '96 : proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Materials Park, Ohio : ASM International, 1996

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Conference Proceeding Book
5
Istfa 2008 : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Materials Park, OH : Asm International, 2008

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Conference Proceeding Book
6
Polymer materials for electronic applications : based on a symposium sponsored by the division of organic coatings and plastics chemistry at the second chemical congress of the north american continent (180th acs national meeting), las vegas, nevada, august 26-27, 1980 /
Washington, DC : American Chemical Society, 1982

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Conference Proceeding Book
7
ISTFA 2000 : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Materials Park, OH : ASM International, 2000

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Conference Proceeding Book
8
ISTFA '99 : proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Materials Park, OH : ASM International, 1999

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Conference Proceeding Book
9
Proceedings of the Symposium on the Degradation of Electronic Devices Due to Device Operation as Well as Crystalline and Process-Induced Defects /
Pennington, NJ : Electrochemical Society, 1994

Conference Proceeding Book
10
Proceedings of the 1996 IEEE International Symposium on Electronics and the Environment, ISEE, 1996 : May 6-8, 1996, Dallas, Texas /
[New York, N.Y.] : Piscataway, N.J. : Institute of Electrical and Electronics Engineers ; Available from IEEE Service Center, 1996

Conference Proceeding Book
11
Proceedings of the 1995 IEEE International Symposium on Electronics and the Environment, ISEE : May 1-3, 1995, Orlando, Florida /
[New York, N.Y.] : Piscataway, N.J. : Institute of Electrical and Electronics Engineers ; Available from IEEE Service Center, 1995

Conference Proceeding Book
12
Proceedings of the 1998 IEEE International Symposium on Electronics and the Environment : ISEE--1998 : May 4-6, 1998, Oak Brook, Illinois /
Piscataway, New Jersey : IEEE, 1998

Conference Proceeding Book
13
Proceedings of the 1997 IEEE International Symposium on Electronics and the Environment, ISEE, 1997 : May 5-7, 1997, San Francisco, California /
[New York, N.Y.] : Piscataway, N.J. : Institute of Electrical and Electronics Engineers ; Available from IEEE Service Center, 1997

Conference Proceeding Book
14
Proceedings : 1994 IEEE International Symposium on Electronics and the Environment, ISEE-1994 : May 2-4, 1994, San Francisco, California /
New York : Piscataway, NJ : IEEE ; Available from IEEE Service Center, 1994

Conference Proceeding Book
15
IEEE/CHMT European International Electronic Manufacturing Technology Symposium : [proceedings].
New York, NY, U.S.A. : IEEE, 1988

Conference Proceeding
16
IEEE/CHMT International Electronic Manufacturing Technology Symposium : [proceedings].
New York, NY, U.S.A. : Institute of Electrical and Electronics Engineers, 1987

Conference Proceeding
17
IEEE/CPMT International Electronic Manufacturing Technology Symposium : [proceedings].
Piscataway, NJ : Institute of Electrical and Electronics Engineers, 1994

Conference Proceeding Journal
18
ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Materials Park, Ohio : ASM International, 2010

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Electronic Conference Proceeding Book
19
ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Materials Park, OH : ASM International, 1998

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Electronic Conference Proceeding Book
20
Proceedings of the 2001 IEEE International Symposium on Electronics and the Environment : 2001 IEEE ISEE May 7-9, 2001, Denver, Colorado /
Piscataway, N.J. : IEEE, 2001

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Electronic Conference Proceeding Book
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