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1
ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Materials Park, Ohio : ASM International, 2010

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Electronic Conference Proceeding Book
2
ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Materials Park, OH : ASM International, 1998

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Electronic Conference Proceeding Book
3
Frontiers in electronics proceedings of the Workshop on Frontiers in Electronics 2009(WOFE) /
River Edge, N.J. : World Scientific, 2009

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Electronic Conference Proceeding Book
4
ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Materials Park, Ohio : ASM International, 2011

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Electronic Conference Proceeding Book
5
Frontiers in electronics
Singapore : World Scientific Pub. Co., 2009

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Electronic Conference Proceeding Book
6
ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Materials Park, OH : ASM International, 2000

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Electronic Conference Proceeding Book
7
ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Materials Park, OH : ASM International, 2002

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Electronic Conference Proceeding Book
8
ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Materials Park, Ohio : ASM International, 2012

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Electronic Conference Proceeding Book
9
ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Materials Park, OH : ASM International, 2004

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Electronic Conference Proceeding Book
10
Finite fields and their applications character sums and polynomials /
Berlin ; Boston : De Gruyter, 2013

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Electronic Conference Proceeding Book
11
ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Materials Park, OH : Asm International, 2008

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Electronic Conference Proceeding Book
12
ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Materials Park, OH : ASM International, 1999

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Electronic Conference Proceeding Book
13
ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Materials Park, Ohio : Asm International, 2009

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Electronic Conference Proceeding Book
14
ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
Materials Park, OH : ASM International, 2006

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Electronic Conference Proceeding Book
15
ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Materials Park, Ohio : ASM International, 2003

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Electronic Conference Proceeding Book
16
Frontiers in electronics proceedings of the WOFE-04, Wyndham Aruba Beach Resort, 17-23 December 2004 /
New Jersey : World Scientific, 2006

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Electronic Conference Proceeding Book
17
Mechanical and Electronics Engineering proceedings of the International Conference on ICMEE 2009, Chennai, India, 24-26 July 2009 /
Singapore ; Hackensack, NJ : World Scientific, 2010

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Electronic Conference Proceeding Book
18
ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Materials Park, OH : ASM International, 1997

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Electronic Conference Proceeding Book
19
ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Materials Park, OH : ASM International, 2007

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Electronic Conference Proceeding Book
20
ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Materials Park, Ohio : ASM International, 1996

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Electronic Conference Proceeding Book
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