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141
Proceedings of the 2010 IEEE International Power Modulator and High Voltage Conference Atlanta, GA, May 23-27, 2010 /
[Piscataway, N.J.] : IEEE, 2010

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Electronic Conference Proceeding Book
142
Reliability physics 1985 23rd annual proceedings : Orlando, Florida, March 26, 27, 28, 1985 /
New York, N.Y. : Electron Devices and Reliability Societies of the Institute of Electrical and Electronic[s] Engineers, 1985

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Electronic Conference Proceeding Book
143
2010 IEEE International SOI Conference Catamaran Resort and Spa, San Diego, California, October 11-14, 2010 /
Piscataway, N.J. : IEEE, 2010

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Electronic Conference Proceeding Book
144
Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the date, 4-7 July 2011 /
[Piscataway, N.J. : IEEE, 2011

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Electronic Conference Proceeding Book
145
16th IEEE International Conference on Advanced Thermal Processing of Semiconductors RTP 2008 : September 30- October 3, 2008, the Platinum Hotel and Spa, Las Vegas, NV /
Piscataway, NJ : IEEE, 2008

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Electronic Conference Proceeding Book
146
2002 IEEE International SOI Conference proceedings : October 7-10, 2002 : the Williamsburg Lodge, Williamsburg, Virginia /
Piscataway, N.J. : IEEE, 2002

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Electronic Conference Proceeding Book
147
SISPAD 2009 2009 International Conference on Simulation of Semiconductor Processes and Devices : September 9-11, 2009, Hotel Del Coronado, San Diego, CA, USA /
Piscataway, NJ : IEEE, 2009

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Electronic Conference Proceeding Book
148
2002 Symposium on VLSI Technology digest of technical papers : June 11-13, 2002, Honolulu /
Piscataway, N.J. : Tokyo, Japan : IEEE ; Business Center for Academic Societies Japan, 2002

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Electronic Conference Proceeding Book
149
Extended abstracts of the eleventh International Workshop on Junction Technology June 9-10, 2011, Kyoto, Japan /
Piscataway, N.J. : IEEE, 2011

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Electronic Conference Proceeding Book
150
47th Annual International Reliability Physics Symposium Montreal, 2009 /
[Piscataway, N.J.] : IEEE, 2009

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Electronic Conference Proceeding Book
151
IWSM 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu /
Piscataway, N.J. : Gaithersburg, Md. : IEEE ; Widerkehr and Associates, 1998

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Electronic Conference Proceeding Book
152
International Electron Devices Meeting, 1996, San Francisco, California, December 8-11, 1996 IEDM technical digest /
Piscataway, N.J. : Institute of Electrical & Electronics Engineers, 1996

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Electronic Conference Proceeding Book
153
Reliability physics 1977 15th annual proceedings, Las Vegas, Nevada, April 12-14, 1977 /
New York : Electron Devices Society and Reliability Group of the Institute of Electrical and Electronics Engineers, 1977

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Electronic Conference Proceeding Book
154
SOI Conference, 2009 IEEE International [proceedings : October 5-8, 2009 : Foster City, California /
[Piscataway, N.J.] : IEEE, 2009

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Electronic Conference Proceeding Book
155
2006 IEEE International Integrated Reliability Workshop final report Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006 /
[Piscataway, N.J. : IEEE Electron Devices Society : IEEE Reliability Society, 2006

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Electronic Conference Proceeding Book
156
Proceedings of the 2008 International Conference on Field-Programmable Technology December 7-10, 2008, the Grand Formosa Regent Hotel, Taipei, Taiwan : FPT '08 Taiwan /
[Piscataway, N.J.] : IEEE, 2008

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Electronic Conference Proceeding Book
157
Device Research Conference conference digest : June 18-20, 2012, The Pennsylvania State University, University Park, Pennsylvania.
[Piscataway, NJ] : IEEE, 2012

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Electronic Conference Proceeding Book
158
2011 International Semiconductor Device Research Symposium 7-9 December, 2011, College Park, MD, USA /
[Piscataway, NJ] : IEEE, 2011

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Electronic Conference Proceeding Book
159
ICSE 2006 2006 IEEE International Conference on Semiconductor Electronics : proceedings : November 29-December 1, 2006, Prince Hotel & Residence Kuala Lumpur, Malaysia /
Piscataway, NJ : Institute of Electrical and Electronics Engineers, 2006

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Electronic Conference Proceeding Book
160
ASDAM '06 conference proceedings the sixth International Conference on Advanced Semiconductor Devices and Microsystems : Smolenice Castle, Slovakia, 16-18 October 2006 /
Piscataway, N.J. : IEEE, 2006

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Electronic Conference Proceeding Book
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