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1
2011 IEEE International Integrated Reliability Workshop Final Report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-20, 2011 /
Piscataway, NJ : IEEE, 2011

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2
25th International Symposium on the Phyisical and Failure Analysis of Integrated Circuits : 16-19 July 2018, Marina Bay Sands, Singapore /
[Piscataway, New Jersey] : IEEE, 2018

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3
IPFA 2013 : proceedings of the 2013 20th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits : 15-19 July, 2013, Shangri-La Hotel, Suzhou, China /
Piscataway, NJ : IEEE, 2013

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4
2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) : June 12-16, 2016, Žofín Palace, Prague, Czech Republic /
[Piscataway, NJ] : IEEE, 2016

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5
ISPSD '09 : proceedings of the 21st International symposium on Power Semiconductor Devices & ICs /
[Piscataway, N.J.] : IEEE, 2009

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6
2006 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium : digest of papers : IMS 2006 : Bridge to the future [San Francisco, CA - June 11-13, 2006] /
Piscataway, N.J. : IEEE, 2006

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7
2011 IEEE Custom Integrated Circuits Conference.
Piscataway : IEEE, 2011

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8
50th Annual Device Research Conference : June 22-24, 1992, Massachusetts Institute of Technology, Cambridge, Mass. /
[New York, N.Y.] : [IEEE], 1992

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9
Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2003 : [scheduled: 7 to 11 July, 2003, Singapore] /
Piscataway, N.J. : IEEE, 2003

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10
2004 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium : digest of papers : [Fort Worth Convention Center, Fort Worth, TX, June 6-8, 2004] /
Piscataway, N.J. : IEEE, 2004

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11
ICMTS 2001 : proceedings of the 2001 International Conference on Microelectronic Test Structures : March 19-22, 2001, Kobe, Japan /
Piscataway, NJ : IEEE, 2001

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12
2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005 /
Piscataway, N.J. : IEEE Electron Devices Society : IEEE Reliability Society, 2005

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13
2010 IEEE International Integrated Reliability Workshop Final Report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-21, 2010 /
Piscataway, N.J. : IEEE, 2010

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14
ICDCS'18 : proceedings of the Fourth International Conference on Devices, Circuits and Systems (ICDCS'18) : 16th to 17th March 2018, Electronics and Communication Engineering, Department of Electrical Sciences.
[Piscataway, New Jersey] : IEEE, 2018

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15
ISPSD'01 : proceedings of the 13th International Symposium on Power Semiconductor Devices and ICs : June 4-7, 2001, Osaka International Convention Center, Japan /
Tokyo, Japan : Institute of Electrical Engineers of Japan, 2001

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16
IEEE International Integrated Reliability Workshop final report /

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Conference Proceeding
17
Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits, and Systems, Cancún, México, March 15-17, 2000 : ICCDCS 2000.
[New York, NY] : Institute of Electrical and Electronics Engineers, 2000

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18
Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures ICMTS : Long Beach Hyatt Regency, Long Beach, California, February 22-23, 1988 /
New York, N.Y. : Institute of Electrical and Electronics Engineers, 1988

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19
Technical digest 2004 : IEEE Compound Semiconductor Integrated Circuit Symposium : 2004 IEEE CSIC Symposium : 26th anniversary, compounding your chips in Monterey : Monterey, CA, USA, October 24-27, 2004 /
Piscataway, NJ : IEEE, 2004

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20
Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits : NUPAD III technical digest : Hilton Hawaiian Village, Honolulu, Hawaii, June 3-4, 1990 /
[New York?] : [Institute of Electrical and Electronics Engineers?], 1990

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