Suggested Topics within your search.
Showing 1 - 20 results of 133 for search '', query time: 0.55s Refine Results
1
Metrics for high-quality specular surfaces /
by Baker, L. R. (Lionel R.)
Bellingham, Wash. : SPIE, 2004

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
2
Laser beam quality metrics /
by Ross, T. Sean
Bellingham, Washington (1000 20th St. Bellingham WA 98225-6705 USA) : SPIE Press, 2013

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
4
Environmental monitoring and hazardous waste site remediation : 19-21 June 1995, Munich, FRG /
Bellingham, Wash., USA : SPIE--the International Society for optical Engineering, 1995

Book
5
Environmental monitoring and remediation technologies : 2-5 November 1998, Boston, Massachusetts /
Bellingham, Wash., USA : SPIE, 1999

Manuscript Book
6
Noise as a tool for studying materials /
Bellingham, Wash., USA : SPIE, 2003

Book
7
Optoelectronic metrology : 28-30 September, 1998, Łańcut, Poland /
Bellingham, Wash., USA : SPIE, 1998

Unknown
8
Scattering and surface roughness : 30-31 July 1997, San Diego, California /
Bellingham, Wash., USA : SPIE, 1997

Physical Object
9
Integrated circuit metrology, inspection, and process control VI : 9-11 March 1992, San Jose, California /
Bellingham, Wash., USA : SPIE, 1992

Conference Proceeding Book
10
Three-dimensional image capture and applications III : 24-25 January 2000, San Jose, California /
Bellingham, Wash., USA : SPIE, 2000

Manuscript Book
11
Laser energy distribution profiles : measurements and applications : 16-18 November 1992, Boston, Massachusetts /
Bellingham, Wash., USA : SPIE, 1993

Physical Object
12
Microsystem metrology and inspection : 15-16 June 1999, Munich, Germany /
Bellingham, Wash., USA : SPIE, 1999

Musical Score Book
13
Laser metrology and inspection : 14-15 June 1999, Munich, Germany /
Bellingham, Wash., USA : SPIE, 1999

Musical Score Book
14
Integrated circuit metrology, inspection, and process control VIII : 28 February-2 March, San Jose, California /
Bellingham, Wash., USA : SPIE, 1994

Conference Proceeding Book
15
Integrated circuit metrology, inspection, and process control IX : 20-22 February 1995, Santa Clara, California /
Bellingham, Wash., USA : SPIE, 1995

Book
16
Three-dimensional image capture and applications : 27-28 January, 1998, San Jose, California /
Bellingham, Wash. : SPIE, 1998

Musical Score Book
17
Integrated circuit metrology, inspection, and process control VII : 2-4 March 1993, San Jose, California /
Bellingham, Wash., USA : SPIE, 1993

Serial
18
Three-dimensional image capture and applications VI : 19-20 January, 2004, San Jose, California, USA /
Bellingham, Wash., USA : SPIE, 2004

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
19
Integrated circuit metrology, inspection, and process control VIII : 28 February-2 March, San Jose, California /
Bellingham, Wash., USA : SPIE, 1994

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Conference Proceeding Book
20
Three-dimensional image capture and applications VII : 16 January 2006, San Jose, California, USA /
Bellingham, Wash. : SPIE, 2006

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
Search Tools: Get RSS Feed — Email this Search — Save Search