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1
Applied scanning probe methods IV : industrial application /
Berlin ; London : Springer, 2005

Book
2
X-ray optics and microanalysis, 1992 : proceedings of the thirteenth international congress, UMIST, Manchester, UK, 31 August-4 September 1992 /
Bristol [England] ; Philadelphia : Institute of Physics, 1993

Conference Proceeding Book
3
Particle beam microanalysis : fundamenals, methods and applications /
by Fuchs, Ekkehard
Weinheim, F.R.G. ; New York, NY, USA : VCH, 1990
1st ed.

Book
5
X-ray optics and microanalysis : proceedings of the 20th International Congress : Karlsruhe, Germany, 15-18 September 2009 /
Melville, N.Y. : American Institute of Physics, 2010

Conference Proceeding Book
6
Scanning probe microscopy for industrial applications : nanomechanical characterization /
Hoboken, New Jersey : John Wiley & Sons, 2013

Book
7
Electron microscopy and multiscale modeling : proceedings of the EMMM-2007 international conference, Moscow, Russia, 3-7 September 2007 /
[Melville, N.Y.] : American Institute of Physics, 2008

Conference Proceeding Book
8
Microstructural characterization of materials /
by Brandon, D. G.
Chichester ; New York : Wiley, 1999

Book
9
Hochauflösende Elektronenmikroskopie in der Werkstofforschung /
by Heydenreich, Johannes
Berlin : Akademie-Verlag, 1983

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Book
10
Industrial applications of electron microscopy /
New York : Marcel Dekker, 2003

Book
11
Analytical electron microscopy for materials science /
by Shindo, Daisuke
Tokyo ; Berlin : Springer, 2002

Book
12
Scanning probe microscopy for industrial applications : nanomechanical characterization /
Hoboken, New Jersey : John Wiley & Sons, Inc., 2014

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Book
13
Imaging methods for novel materials and challenging applications. Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics /
New York, NY : Springer, 2013

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Electronic Conference Proceeding Book
14
Microstructural design of advanced engineering materials
Chichester, West Sussex ; Hoboken, NJ : Wiley-VCH, 2013

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Electronic Book
15
Microstructural characterization of materials
by Brandon, D. G.
Chichester ; New York : J. Wiley, 1999

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Electronic Book
16
Advances in acoustic microscopy /
New York : Plenum Press, 1996

Book
17
Acoustic microscopy
by Briggs, Andrew
Oxford : Oxford University Press, 2010
2nd ed.

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Electronic Book
18
An introduction to acoustic microscopy /
by Briggs, Andrew
Oxford, England : Oxford University Press, 1985

Book
19
Applied scanning probe methods.
Berlin ; New York : Springer, 2007

Book
20
In situ electron microscopy of materials : November 28-December 2, 2005, Boston, Massachusetts, USA.
Warrendale, PA : Materials Research Society, 2005

Book
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