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1
ISTFA 2004 : Proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Materials Park, OH : ASM International, 2004

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Conference Proceeding Book
2
ISTFA 2003 : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Materials Park, Ohio : ASM International, 2003

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Conference Proceeding Book
3
ISTFA 2002 : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Materials Park, OH : ASM International, 2002

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Conference Proceeding Book
4
ISTFA '96 : proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Materials Park, Ohio : ASM International, 1996

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Conference Proceeding Book
5
Istfa 2008 : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Materials Park, OH : Asm International, 2008

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Conference Proceeding Book
6
ISTFA 2000 : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Materials Park, OH : ASM International, 2000

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Conference Proceeding Book
7
Advances in neurotechnology, electronics and informatics : revised selected papers from the 2nd International Congress on Neurotechnology, Electronics and Informatics (NEUROTECHNIX 2014), October 25-26, Rome, Italy /
Cham : Springer, 2016

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Conference Proceeding Book
8
ISTFA '99 : proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Materials Park, OH : ASM International, 1999

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Conference Proceeding Book
9
EASCON '71 record.
[New York, Institute of Electrical and Electronics Engineers, 1971

Conference Proceeding Book
10
IEEE ... Electronicom.
[Don Mills, Ont., Canada : Electronicom, 1985

Conference Proceeding
12
Computers and communications technology toward 2000 : proceedings /
[Seoul, Korea?] : IEEE, 1987

Conference Proceeding Book
13
Proceedings of the 1996 IEEE International Symposium on Electronics and the Environment, ISEE, 1996 : May 6-8, 1996, Dallas, Texas /
[New York, N.Y.] : Piscataway, N.J. : Institute of Electrical and Electronics Engineers ; Available from IEEE Service Center, 1996

Conference Proceeding Book
14
IEEE Region Six conference record.

Serial
15
Proceedings '73 /
[Tel-Aviv] : IEEE [published with the kind assistance of the American Israeli Paper Mills, 1973

Conference Proceeding Book
16
Conference record, Seventeenth Asilomar Conference on Circuits, Systems & Computers : papers presented October 31-November 2, 1983, Santa Clara, California /
Silver Spring, MD : Los Angeles, CA : Piscataway, NJ : IEEE Computer Society Press ; Order from IEEE Computer Society ; IEEE Service center, 1984

Conference Proceeding Book
17
Proceedings of the 1995 IEEE International Symposium on Electronics and the Environment, ISEE : May 1-3, 1995, Orlando, Florida /
[New York, N.Y.] : Piscataway, N.J. : Institute of Electrical and Electronics Engineers ; Available from IEEE Service Center, 1995

Conference Proceeding Book
18
1978 IEEE International Symposium on Electromagnetic Compatibility, June 20-22, 1978, Sheraton-Biltmore Hotel, Atlanta, Georgia /
New York : Institute of Electrical and Electronics Engineers, 1978

Conference Proceeding Book
19
Southcon/96 conference record : Orange County Convention Center, Orlando, Florida, June 25-27, 1996 /
[New York, N.Y.] : Piscataway, NJ : Institute of Electrical and Electronics Engineers ; IEEE Operations Center [distributor], 1996

Conference Proceeding Book
20
Conference record : twelfth Asilomar Conference on Circuits, Systems, and Computers : papers presented November 6-8, 1978, Pacific Grove, California /
New York : Long Beach, CA : Institute of Electrical and Electronics Engineers : available from IEEE Computer Society, 1979

Conference Proceeding Book
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