Search Results

1

A self adapting production system for test time reduction of semiconductor integrted circuit memories /

A self adapting production system for test time reduction of semiconductor integrted circuit memories /

by Smith, Glen A.
1991

Thesis Book

2

A prototype control and data path synthesis system /

A prototype control and data path synthesis system /

by Migatz, William R., 1966-
1990

Thesis Book

3

VLSI implementation of distributed arithmetic /

VLSI implementation of distributed arithmetic /

by Huang, Dajen, 1959-
1989

Thesis Book

4

A method for automatice alignment of ceramic IC packages during wire bond inspection /

A method for automatice alignment of ceramic IC packages during wire bond inspection /

by Hofmeister, Christine Ruth, 1959-
1987

Thesis Book

5

An ASIC implementation of the proposed IEEE standard for designing testable circuits /

An ASIC implementation of the proposed IEEE standard for designing testable circuits /

by Kiang, Susan Shushien, 1964-
1990

Thesis Book

6

Automation of IC package design using PEX /

Automation of IC package design using PEX /

by Kulasekaran, Ravi, 1964-
1988

Thesis Book

7

Laser programming of gallium arsenide HFET digital integrated circuits /

Laser programming of gallium arsenide HFET digital integrated circuits /

by Fischer, Frederick, H., 1958-
1988

Thesis Book

8

Modeling temperature cycling effects on packaged integrated circuits /

Modeling temperature cycling effects on packaged integrated circuits /

by Twigg, Donald Ray, 1958-
1984

Thesis Book

9

VEST, a language specifying editing algorithms and a program for applying them to test vectors /

VEST, a language specifying editing algorithms and a program for applying them to test vectors /

by Ahrens, Daniel P., 1958-
1986

Thesis Book

10

An automated wafer test system for solid-state sensors /

An automated wafer test system for solid-state sensors /

by Orphanos, Paul Alexander James, 1966-
1992

Thesis Book

11

A general IC test program structure /

A general IC test program structure /

by Wahl, Ernst J., 1947-
1988

Thesis Book

12

Design and analysis of fault-tolerant systolic array with built- in self-test /

Design and analysis of fault-tolerant systolic array with built- in self-test /

by Ip, Joseph Chun-Shing
1992

Thesis Book

13

Microstructural characterization of aluminum nitride substrates and metallization interfaces /

Microstructural characterization of aluminum nitride substrates and metallization interfaces /

by Westwood, Alistair Duncan, 1965-
1988

Thesis Book

14

The design and fabrication of a UHF voltage-controlled oscillator bipolar integrated circuit and a study of chip-level interconnects /

The design and fabrication of a UHF voltage-controlled oscillator bipolar integrated circuit and a study of chip-level interconnects /

by Williams, Douglas Alan, 1958-
1990

Thesis Book

15

Surface mount device technology : (an approach using an Expert System (PEX)) /

Surface mount device technology : (an approach using an Expert System (PEX)) /

by Chaudhry, Udey
1989

Thesis Book

16

The development of LSI grade logic families for digital GaAs integrated circuits /

The development of LSI grade logic families for digital GaAs integrated circuits /

by Faris, Aziz I.
1989

Thesis Book

17

A high speed 2-D DCT/IDCT processor /

A high speed 2-D DCT/IDCT processor /

by Slawecki, Darren
1991

Thesis Book

18

Reaction of Ti, Ti/Ni and Ti/Pt thin films on AlN substrates /

Reaction of Ti, Ti/Ni and Ti/Pt thin films on AlN substrates /

by Imanaka, Yoshihiko, 1960-
1994

Thesis Book

19

Event-driven logic simulator /

Event-driven logic simulator /

by Chen, Hue-Hua Ann, 1951-
1992

Thesis Book

20

A new approach to fault coverage /

A new approach to fault coverage /

by Prasad, Basundhara, 1960-
1988

Thesis Book

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