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1
Introduction to optical testing /
by Geary, Joseph M.
Bellingham, Wash. : SPIE, 1993

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
2
Laser beam quality metrics /
by Ross, T. Sean
Bellingham, Washington (1000 20th St. Bellingham WA 98225-6705 USA) : SPIE Press, 2013

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
3
Field guide to interferometric optical testing /
by Goodwin, Eric P.
Bellingham, Wash. : SPIE, 2006

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
4
Smart structures and materials 2003.
Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, 2003

Conference Proceeding Book
5
Nondestructive evaluation of utilities and pipelines : 4-5 December 1996, Scottsdale, Arizona /
Bellingham, Wash. : SPIE, 1996

Manuscript Book
7
Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado /
Bellingham, Wash., USA : SPIE, 1999

Manuscript Book
8
Spectroscopic characterization techniques for semiconductor technology IV : 25-26 March 1992, Somerset, New Jersey /
Bellingham, Wash., U.S.A. : The Society, 1992

Book
9
Spectroscopic characterization techniques for semiconductor technology V : 25-26 March 1994, Los Angeles, California /
Bellingham, Wash., USA : SPIE, 1994

Audio
10
International Symposium on Optical Fabrication, Testing, and Surface Evaluation : 10-12 June 1992, Tokyo, Japan /
Bellingham, Wash. : SPIE, 1992

Conference Proceeding Book
11
International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 : 13-15 May 1997, Kiev, Ukraine /
Bellingham, Wash., USA : SPIE, 1998

Conference Proceeding Manuscript Book
12
Advanced microwave and millimeter-wave detectors : 25-26 July 1994, San Diego, California /
Bellingham, Wash., USA : SPIE, 1994

Book
13
Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France /
Bellingham, Wash., USA : SPIE, 1999

Book
14
X rays in materials analysis II : novel applications and recent developments : 25-26 July 1991, San Diego, California /
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, 1991

Book
15
Optical fiber reliability and testing : 19-20 September 1999, Boston, Massachusetts /
Bellingham, Wash., USA : SPIE, 1999

Manuscript Book
16
Nondestructive evaluation of utilities and pipelines II : 1 April, 1998, San Antonio, Texas /
Bellingham, Wash. : SPIE, 1998

Map
17
Nondestructive evaluation of aging bridges and highways : 6-7 June 1995, Oakland, California /
Bellingham, Wash., USA : SPIE, 1995

Manuscript
19
Smart focal plane arrays and focal plane array testing : 17-18 April 1995, Orlando, Florida /
Bellingham, Wash., USA : SPIE, 1995

Book
20
Optical diagnostic methods for inorganic materials II : 3-4 August 2000, San Diego, USA /
Bellingham, Wash., USA : SPIE, 2000

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
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