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1
Process and equipment control in microelectronic manufacturing : 19-20 May, 1999, Edinburgh, Scotland /
Bellingham, Wash., USA : SPIE, 1999

Book
2
In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May, 1999, Edinburgh, Scotland /
Bellingham, Wash., USA : SPIE, 1999

Musical Score Book
3
Process and equipment control in microelectronic manufacturing II : 30-31 May 2001, Edinburgh, UK /
Bellingham, Wash. : SPIE, 2001

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
4
Micro-opto-electro-mechanical systems : 22-23 May 2000, Glasgow, Scotland, United Kingdom /
Bellingham, Wash., USA : SPIE, 2000

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
5
Lithography for semiconductor manufacturing II : 30 May-1 June, 2001, Edinburgh, UK /
Bellingham, Wash. : SPIE, 2001

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
6
In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /
Bellingham, Wash. : SPIE, 2001

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
7
Fifth European Conference on Smart Structures and Materials : 22-24 May 2000, Glasgow, Scotland, United Kingdom /
Bellingham, Wash., USA : SPIE, 2000

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Conference Proceeding Book
8
MEMS design, fabrication, characterization, and packaging : 30 May-1 June 2001, Edinburgh, UK /
Bellingham, Wash., USA : SPIE, 2001

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
9
Optical diagnostics for industrial applications : 22-24 May 2000, Glasgow, Scotland, United Kingdom /
Bellingham, Wash., USA : SPIE, 2000

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
10
In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May, 1999, Edinburgh, Scotland /
Bellingham, Wash., USA : SPIE, 1999

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
11
Applications of optical fiber sensors : 22-24 May 2000, Glasgow, Scotland, United Kingdom /
Bellingham, Wash., USA : SPIE, 2000

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Book
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