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1
Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1999 : Orlando, Florida September 28-30, 1999 /
Rome, NY : The Association, 1999

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2
International Conference on Systems Engineering.

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3
Advances in networked enterprises : virtual organizations, balanced automation, and systems integration : IFIP TC5/WG5.3 Fourth IFIP/IEEE International Conference on Information Technology for Balanced Automation Systems in Manufacture and Transportation, September 27-29, 2000, Berlin, Germany /
Boston, MA : Kluwer Academic, 2000

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5
Conference record for 1985 IEEE Third Conference on Human Factors and Nuclear Safety, June 23-27, 1985, Monterey, California /
New York, N.Y. (345 E. 47th St., New York 10017) : Institute of Electrical and Electronics Engineers, 1985

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6
Proceedings of the Electrical/Electronics Insulation Conference.

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7
Annual Reliability and Maintainability Symposium : 1992 proceedings, Las Vegas, Nevada, USA, January 21-23, 1992.
[New York] : Institute of Electrical and Electronics Engineers, 1992

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8
Canadian Communications and EHV Conference.
New York, Institute of Electrical and Electronics Engineers, 1972

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9
Conference record.

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10
Proceedings : CVPR.
Silver Spring, Md. : IEEE Computer Society Press : [publisher not identified], 1983

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12
IEEE ... IECON proceedings.
New York, N.Y. : Institute of Electrical and Electronics Engineers, 1983

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13
Proceedings /
New York, N.Y. : Piscataway, N.J. : Institute of Electrical and Electronics Engineers ; Additional copies may be ordered from IEEE Service Center, 1983

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14
Annual Reliability and Maintainability Symposium : 2001 proceedings : The International Symposium on Product Quality & Integrity : Philadelphia, Pennsylvania USA, 2001 January 22-25.
Piscataway, N.J. : Institute of Electrical and Electronics Engineers, 2001

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15
International Electron Devices Meeting.
New York : Institute of Electrical and Electronics Engineers, 1969

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16
Digest /
Piscataway, N.J. : IEEE Service Center, 1991

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17
Conference digest.

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18
Conference paper[s].
New York, Institute of Electrical and Electronics Engineers, 1972

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19
CAS 2005 proceedings : 2005 International Semiconductor Conference, 28th edition, October 3-5, 2005, Sinaia, Romania.
Piscataway, NJ : IEEE, 2005

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20
International Test Conference, 1993 : proceedings.
Altoona, PA : Piscataway, NJ : International Test Conference ; [Distributor] IEEE Service Center, 1993

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