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1
2011 IEEE International Conference on Microelectronic Test Structures 24th ICMTS Conference proceedings, April 4-7, Amsterdam, NL /
[Piscataway, N.J.] : IEEE, 2011

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Electronic Conference Proceeding Book
2
2009 27th IEEE VLSI Test Symposium proceedings : 3-7 May 2009 Santa Cruz, CA, USA : VTS 2009 /
Los Alamitos, Calif. : IEEE Computer Society, 2009

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Electronic Conference Proceeding Book
3
Reliability physics 1974 12th annual proceedings : Las Vegas, Nevada, April 2-4, 1974 /
New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, 1974

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Electronic Conference Proceeding Book
4
IEEE Autotestcon 2009 proceedings Systems Readiness Technology Conference "mission assurance through advanced ATE" /
Piscataway, NJ : IEEE, 2009

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Electronic Conference Proceeding Book
5
Rotorcraft Safety Symposium Savoy Place, London on Wednesday, 9 April 1997 /
London : Institution of Electrical Engineers, 1997

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Electronic Conference Proceeding Book
6
Proceedings of the Fourth Asia Symposium on Quality Electronic Design ASQED 2012, July 10-11, 2012, Penang, Malaysia /
Piscataway, NJ : IEEE, 2012

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Electronic Conference Proceeding Book
7
2008 IEEE International Conference on Microelectronic Test Structures ICMTS : conference proceedings : March 24-27, the University of Edinburgh, UK.
Piscataway, NJ : IEEE, 2008

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Electronic Conference Proceeding Book
8
Fourth IEEE International Symposium on Electronic Design, Test and Applications proceedings : [Delta] '08, 23-25 January 2008, Hong Kong, SAR, China /
Los Alamitos, Calif. : IEEE Computer Society, 2008

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Electronic Conference Proceeding Book
9
Reliability physics 1978 16th annual proceedings : San Diego, California, April 18-20, 1978 /
New York : IEEE Electroni Devices Society, 1978

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Electronic Conference Proceeding Book
10
MTDT 2009 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan.
Los Alamitos, Calif. : IEEE Computer Society, 2009

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Electronic Conference Proceeding Book
11
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) April 18-20, 2012, Tallinn, Estonia
Piscataway, NJ : IEEE, 2012

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Electronic Conference Proceeding Book
12
7th International Symposium on Quality Electronic Design ISQED 2006, proceedings : 27-29 March 2006, San Jose, California /
Los Alamitos, Calif. : IEEE Computer Society, 2006

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Electronic Conference Proceeding Book
13
Reliability physics 1980 18th annual proceedings : Las Vegas, Nevada, April 8-10, 1980 /
New York : Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers, 1980

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Electronic Conference Proceeding Book
14
2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era proceedings : September 2-5, 2007, Rabat, Marocco [i.e. Morocco] /
[Piscataway, N.J.] : IEEE, 2007

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Electronic Conference Proceeding Book
15
25th IEEE VLSI Test Symposium proceedings : 6-10 May, 2007, Berkeley, California /
Los Alamitos, Calif. : IEEE Computer Society, 2007

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Electronic Conference Proceeding Book
16
IDT 2007 the 2007 2nd International Design and Test Workshop : proceedings : December 16-18, 2007, Grand Hyatt Hotel, Cairo, Egypt /
Piscataway, NJ : IEEE, 2007

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Electronic Conference Proceeding Book
17
Sixth International Workshop on Microprocessor Test and Verification common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005 /
Los Alamitos, Calif. : IEEE, 2006

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Electronic Conference Proceeding Book
18
MTV 2009 10th International Workshop on Microprocessor Test and Verification : proceedings, 7-9 December 2009, Austin, TX, USA.
Los Alamitos, Calif. : IEEE Computer Society, 2009

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Electronic Conference Proceeding Book
19
ICMTS 2009 2009 IEEE International Conference on Microelectronic Test Structures : Embassy Suites, Mandalay Beach Hotel, Oxnard, CA, March 31-April 2, 2009 /
Piscataway, NJ : IEEE, 2009

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Electronic Conference Proceeding Book
20
Proceedings, IOLTS 2007 13th IEEE International On-Line Testing Symposium : Heraklion, Crete, Greece, 8-11 July, 2007 /
[Piscataway, N.J.] : IEEE Xplore, 2007

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Electronic Conference Proceeding Book
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