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1
ITC : International Test Conference 1999 proceedings : September 28-30, 1999, New Atlantic City Convention Center, Atlantic City, NJ, USA /
Washington, DC : Piscataway New Jersey : International Test Conference ; IEEE, 1999

Conference Proceeding Book
2
Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. /
Washington, D.C. : Los Angeles, CA : Computer Society Press of the IEEE ; Order from Computer Society of the IEEE, 1987

Conference Proceeding Book
3
Memory LSI : digest of papers /
New York : Institute of Electrical and Electronics Engineers, 1977

Conference Proceeding Book
4
Digest of papers : Memory & LSI /
New York : Institute of Electrical and Electronics Engineers, 1976

Conference Proceeding Book
5
Memory, LSI, linear IC : digest of papers /
Long Beach, Calif. : IEEE Computer Society Publications Office, 1975

Conference Proceeding Book
6
Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982 /
Silver Spring, MD (1109 Spring St., Suite 300) : IEEE Computer Society Press, 1982

Conference Proceeding Book
7
ITC : International Test Conference : proceedings : October 18-23, 1998, Marriott Wardman Park Hotel, Washington, D.C., USA /
Washington, DC : Piscataway New Jersey : International Test Conference ; IEEE, 1998

Conference Proceeding Book
8
Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /
Silver Spring, MD : Los Angeles, CA : IEEE Computer Society Press ; Order from IEEE Computer Society, 1983

Conference Proceeding Book
9
1983 IEEE ATPG workshop proceedings : March 15-16, 1983, San Francisco, California.
Silver Spring, MD : IEEE Computer Society Press, 1983

Conference Proceeding Book
10
Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA /
Los Alamitos, Calif. : IEEE Computer Society Press, 1999

Conference Proceeding Book
11
Proceedings : Testing's changing role /
Silver Spring, MD (1109 Spring St., Suite 300, Silver Spring, 20910) : IEEE Computer Society Press, 1983

Conference Proceeding Book
12
MTDT 2009 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan.
Los Alamitos, Calif. : IEEE Computer Society, 2009

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Electronic Conference Proceeding Book
13
Memory & LSI, Linear IC : digest of papers, 1975 Semiconductor Test Symposium, October 14-16, 1975, held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
New York : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; available from IEEE Computer Society Publications Office, 1975

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Conference Proceeding Book
14
Tutorial : LSI testing /
Long Beach, Calif. : IEEE Computer Society, 1978
Second edition.

Conference Proceeding Book
15
Memory & LSI : digest of papers /
New York : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; available from IEEE Computer Society Publications Office, 1976

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Conference Proceeding Book
16
MTV 2009 10th International Workshop on Microprocessor Test and Verification : proceedings, 7-9 December 2009, Austin, TX, USA.
Los Alamitos, Calif. : IEEE Computer Society, 2009

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Electronic Conference Proceeding Book
17
IEEE design & test of computers

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Electronic Journal
18
ETS 2009 European Test Symposium : proceedings, 25-29 May, 2009, Sevilla, Spain.
Los Alamitos, Calif. : IEEE Computer Society, 2009

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Electronic Conference Proceeding Book
19
HLDVT '11 IEEE International High Level Design Validation and Test Workshop : conference proceedings : [sixteenth annual workshop] : November 10-11, 2011 : Napa Valley Marriott, Napa Valley, CA /
[Piscataway, N.J.] : IEEE, 2011

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Electronic Conference Proceeding Book
20
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems April 13-15, 2011, Cottbus, Germany /
Piscataway, N.J. : IEEE, 2011

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Electronic Conference Proceeding Book
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