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1
ITC : International Test Conference 1999 proceedings : September 28-30, 1999, New Atlantic City Convention Center, Atlantic City, NJ, USA /
Washington, DC : Piscataway New Jersey : International Test Conference ; IEEE, 1999

Conference Proceeding Book
2
Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. /
Washington, D.C. : Los Angeles, CA : Computer Society Press of the IEEE ; Order from Computer Society of the IEEE, 1987

Conference Proceeding Book
3
Memory LSI : digest of papers /
New York : Institute of Electrical and Electronics Engineers, 1977

Conference Proceeding Book
4
Digest of papers : Memory & LSI /
New York : Institute of Electrical and Electronics Engineers, 1976

Conference Proceeding Book
5
Memory, LSI, linear IC : digest of papers /
Long Beach, Calif. : IEEE Computer Society Publications Office, 1975

Conference Proceeding Book
6
ITC : International Test Conference : proceedings : October 18-23, 1998, Marriott Wardman Park Hotel, Washington, D.C., USA /
Washington, DC : Piscataway New Jersey : International Test Conference ; IEEE, 1998

Conference Proceeding Book
7
Proceedings : Testing's changing role /
Silver Spring, MD (1109 Spring St., Suite 300, Silver Spring, 20910) : IEEE Computer Society Press, 1983

Conference Proceeding Book
8
Memory & LSI, Linear IC : digest of papers, 1975 Semiconductor Test Symposium, October 14-16, 1975, held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
New York : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; available from IEEE Computer Society Publications Office, 1975

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Conference Proceeding Book
9
Memory & LSI : digest of papers /
New York : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; available from IEEE Computer Society Publications Office, 1976

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Conference Proceeding Book
10
International Test Conference 2011 : [42nd] Proceedings : September 18-23, 2011 : Disneyland Hotel, Anaheim, California USA /
[Piscataway, N.J.] : IEEE Computer Society, 2011

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Conference Proceeding Book
11
International Test Conference 2012 : [43rd] Proceedings : November 6-8, 2012 : Disneyland Hotel, Anaheim, California USA /
[Piscataway, N.J.] : IEEE Computer Society, 2012

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Conference Proceeding Book
12
1986 IEEE Workstation Technology & Systems Conference : proceedings, Bally's Park Place Casino Hotel--Atlantic City, N.J. March 17-20, 1986 /
Washington, D.C. : Los Angeles, CA : IEEE Computer Society Press ; Order from IEEE Computer Society, 1986

Conference Proceeding Book
13
Proceedings /

Conference Proceeding
14
Integration of test with design and manufacturing : International Test Conference, 1987, proceedings, September 1, 2, 3, 1987 /
Washington, D.C. : IEEE Computer Society Press, 1987

Conference Proceeding Book
15
Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /
Washington, D.C. : IEEE Computer Society Press, 1986

Conference Proceeding Book
16
The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /
Washington, D.C. : Los Angeles, CA : IEEE Computer Society Press ; Order from IEEE Computer Society, 1985

Conference Proceeding Book
17
Memory & LSI : digest of papers /
New York : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; available from IEEE Computer Society Publications Office, 1977

Conference Proceeding Book
18
Memory & LSI; digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
New York : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; available from IEEE Computer Society Publications Office, 1974

Conference Proceeding Book
19
International Test Conference : proceedings : October 18-23, 1998, Marriott Wardman Park Hotel, Washington, D.C., USA /
Washington, DC : Piscataway New Jersey : International Test Conference ; IEEE, 1998

Conference Proceeding Book
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