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1
Workshop on Mass Flow Measurement and Control for the Semiconductor Industry /
Gaithersburg, Md. : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 2001
“...Conference papers and proceedings. fast (OCoLC)fst01423772...”

Government Document Conference Proceeding Book
2
Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : San Jose, CA, USA, March 9-11, 2004 /
Piscataway, N.J. : IEEE, 2004
“...Conference papers and proceedings. fast (OCoLC)fst01423772...”

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Conference Proceeding Book
3
Twenty Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM : proceedings 2013, San Jose, CA USA, March 17-21, 2013 /
Piscataway, NJ : IEEE, 2013
“...Conference papers and proceedings. fast (OCoLC)fst01423772...”

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Conference Proceeding Book
4
Twenty Eighth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM : proceedings 2012, San Jose, CA USA, March 18-22, 2012 /
Piscataway, NJ : IEEE, 2012
“...Conference papers and proceedings. fast (OCoLC)fst01423772...”

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Conference Proceeding Book
5
Twenty Second Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2006 : Dallas, TX, USA, March 14-16, 2006 /
Piscataway, N.J. : IEEE, 2006
“...Conference papers and proceedings. fast (OCoLC)fst01423772...”

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Conference Proceeding Book
6
Twenty Seventh Annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2011 : San Jose, CA, USA : March 20-24, 2011 /
[Piscataway, N.J.] : IEEE, 2011
“...Conference papers and proceedings. fast (OCoLC)fst01423772...”

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Conference Proceeding Book
7
Twenty First Annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2005 : San Jose, CA, USA, March 15-17, 2005 /
Piscataway, N.J. : IEEE, 2005
“...Conference papers and proceedings. fast (OCoLC)fst01423772...”

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Conference Proceeding Book
8
Semiconductor measurement technology : Workshop on Mass Flow Measurement and Control for the Semiconductor Industry /
Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2001
“...Conference papers and proceedings. fast (OCoLC)fst01423772...”

Conference Proceeding Book
9
Twenty Fourth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2008, San Jose, CA USA, March 16-20, 2008 /
[Piscataway, N.J.] : IEEE Xplore, 2008
“...Conference papers and proceedings. fast (OCoLC)fst01423772...”

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Conference Proceeding Book
10
Twenty Fifth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2009, San Jose, CA USA, March 15-19, 2009 /
[Piscataway, N.J.] : IEEE Xplore, 2009
“...Conference papers and proceedings. fast (OCoLC)fst01423772...”

This item is not available through EZBorrow. Please contact your institution’s interlibrary loan office for further assistance.
Conference Proceeding Book
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