2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France /

書目詳細資料
Corporate Authors: European Congress on Optics Applied to Metrology Strasbourg, European Photonics Association, Society of Photo-optical Instrumentation Engineers, Optics, Photonics, and Iconics Engineering Meeting
其他作者: Grosmann, Michel, Meyrueis, Patrick
格式: Conference Proceeding 樂譜 圖書
語言:English
出版: Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, [1980]
叢編:Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 210.
主題:

Penn State

持有資料詳情 Penn State
索引號: TA1505.S65 v.210