Proceedings, International Test Conference 1995.

Proceedings, International Test Conference 1995.

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Bibliographic Details
Corporate Authors: International Test Conference Washington, D.C., Institute of Electrical and Electronics Engineers, IEEE Computer Society
Format: Conference Proceeding Book
Language:English
Published: Altoona, PA : Piscataway N.J. : The Conference ; Additional copies can be ordered from the IEEE Service Center, c1995.
Subjects:
Integrated circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Telecommunication > Congresses.
Fuzzy logic > Congresses.
Radio frequency > Congresses.
Neural networks (Computer science) > Congresses.

Carnegie Mellon

Holdings details from Carnegie Mellon
Call Number: 621.3819546 S47M 1995

University of Pittsburgh

Holdings details from University of Pittsburgh
Call Number: TK7874 I474 1995

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