Technologies for synthetic environments : hardware-in-the-loop testing IX : 13-14 April, 2004, Orlando, Florida, USA /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, SPIE Digital Library
Other Authors: Murrer, Robert Lee
Format: Book
Language:English
Published: Bellingham, Wash. : SPIE, [2004]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5408.
Subjects:

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Lehigh

Holdings details from Lehigh
Call Number: Electronic book