Micro-optical technologies for measurement, sensors, and microsystems : 12-13 June 1996, Besançon, France /

Bibliographic Details
Corporate Authors: Centre national de la recherche scientifique (France), SPIE Digital Library
Other Authors: Parriaux, Olivier M.
Format: Book
Language:English
Published: Bellingham, Wash. : SPIE--the International Society for Optical Engineering, [1996]
Series:Europto series.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2783.
Subjects:

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Lehigh

Holdings details from Lehigh
Call Number: Electronic book