Two- and three-dimensional vision systems for inspection, control, and metrology II : 26-27 October, 2004, Philadelphia, Pennsylvania, USA /

Two- and three-dimensional vision systems for inspection, control, and metrology II : 26-27 October, 2004, Philadelphia, Pennsylvania, USA /

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Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Denshi Jōhō Tsūshin Gakkai (Japan). Tsūshin Sosaieti, Denshi Jōhō Tsūshin Gakkai (Japan). Erekutoronikusu Sosaieti, SPIE Digital Library
Other Authors: Harding, Kevin G.
Format: Book
Language:English
Published: Bellingham, Wash. : SPIE, [2004]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5606.
Subjects:
Computer vision > Congresses.
Imaging systems > Congresses.
Three-dimensional display systems > Congresses.
Optical pattern recognition > Congresses.
Quality control > Optical methods > Congresses.
Optical measurements > Congresses.
Metrology > Congresses.
Electronic books.

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